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Thickness-dependent optimization of Er3+ light emission from silicon-rich silicon oxide thin films.
Cueff, Sébastien; Labbé, Christophe; Jambois, Olivier; Garrido, Blas; Portier, Xavier; Rizk, Richard.
Affiliation
  • Cueff S; Centre de Recherche sur les Ions, les Matériaux et la Photonique (CIMAP), ENSICAEN, CNRS, CEA/IRAMIS, Université de Caen, 14050 CAEN cedex, France. richard.rizk@ensicaen.fr.
Nanoscale Res Lett ; 6(1): 395, 2011 May 25.
Article in En | MEDLINE | ID: mdl-21711930
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanoscale Res Lett Year: 2011 Document type: Article Affiliation country: Francia Country of publication: Estados Unidos
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanoscale Res Lett Year: 2011 Document type: Article Affiliation country: Francia Country of publication: Estados Unidos