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High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM.
Vaudin, M D; Stan, G; Gerbig, Y B; Cook, R F.
Affiliation
  • Vaudin MD; Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. mark.vaudin@nist.gov
Ultramicroscopy ; 111(8): 1206-13, 2011 Jul.
Article in En | MEDLINE | ID: mdl-21763237
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2011 Document type: Article Affiliation country: Estados Unidos Country of publication: Países Bajos
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2011 Document type: Article Affiliation country: Estados Unidos Country of publication: Países Bajos