Microstructure and crystallization kinetics analysis of the (In15Sb85)(100-x)Zn(x) phase change recording thin films. | J Nanosci Nanotechnol;11(12): 10922-5, 2011 Dec. | MEDLINE

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Microstructure and crystallization kinetics analysis of the (In15Sb85)(100-x)Zn(x) phase change recording thin films.

Ou, S L; Kuo, P C; Sheu, S C; Shen, C L; Tsai, T L; Chen, S C; Chiang, D Y.

Affiliation

Ou SL; Institute of Materials Science and Engineering, National Taiwan University, No. 1, Sec. 4, Roosevelt Road, Taipei 10617, Taiwan.

J Nanosci Nanotechnol ; 11(12): 10922-5, 2011 Dec.

Article in En | MEDLINE | ID: mdl-22409026

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Collection: 01-internacional Database: MEDLINE Language: En Journal: J Nanosci Nanotechnol Year: 2011 Document type: Article Affiliation country: Taiwán Country of publication: Estados Unidos

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Collection: 01-internacional Database: MEDLINE Language: En Journal: J Nanosci Nanotechnol Year: 2011 Document type: Article Affiliation country: Taiwán Country of publication: Estados Unidos