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The defect and transport properties of acceptor doped TlBr: role of dopant exsolution and association.
Bishop, Sean R; Tuller, Harry L; Ciampi, Guido; Higgins, William; Engel, Johanna; Churilov, Alexei; Shah, Kanai S.
Affiliation
  • Bishop SR; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA.
Phys Chem Chem Phys ; 14(29): 10160-7, 2012 Aug 07.
Article in En | MEDLINE | ID: mdl-22722657
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Risk_factors_studies Language: En Journal: Phys Chem Chem Phys Journal subject: BIOFISICA / QUIMICA Year: 2012 Document type: Article Affiliation country: Estados Unidos Country of publication: Reino Unido
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Risk_factors_studies Language: En Journal: Phys Chem Chem Phys Journal subject: BIOFISICA / QUIMICA Year: 2012 Document type: Article Affiliation country: Estados Unidos Country of publication: Reino Unido