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Characterization of electroforming-free titanium dioxide memristors.
Strachan, John Paul; Yang, J Joshua; Montoro, L A; Ospina, C A; Ramirez, A J; Kilcoyne, A L D; Medeiros-Ribeiro, Gilberto; Williams, R Stanley.
Affiliation
  • Strachan JP; nanoElectronics Research Group, HP Labs, 1501 Page Mill Rd, Palo Alto, CA 94304, USA.
Beilstein J Nanotechnol ; 4: 467-73, 2013.
Article in En | MEDLINE | ID: mdl-23946916
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Beilstein J Nanotechnol Year: 2013 Document type: Article Affiliation country: Estados Unidos Country of publication: Alemania
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Add to My VHL
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Beilstein J Nanotechnol Year: 2013 Document type: Article Affiliation country: Estados Unidos Country of publication: Alemania