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2D microwave imaging reflectometer electronics.
Spear, A G; Domier, C W; Hu, X; Muscatello, C M; Ren, X; Tobias, B J; Luhmann, N C.
Affiliation
  • Spear AG; Electrical & Computer Engineering, University of California, Davis, California 95616, USA.
  • Domier CW; Electrical & Computer Engineering, University of California, Davis, California 95616, USA.
  • Hu X; Electrical & Computer Engineering, University of California, Davis, California 95616, USA.
  • Muscatello CM; Electrical & Computer Engineering, University of California, Davis, California 95616, USA.
  • Ren X; Electrical & Computer Engineering, University of California, Davis, California 95616, USA.
  • Tobias BJ; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
  • Luhmann NC; Electrical & Computer Engineering, University of California, Davis, California 95616, USA.
Rev Sci Instrum ; 85(11): 11D834, 2014 Nov.
Article in En | MEDLINE | ID: mdl-25430247
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2014 Document type: Article Affiliation country: Estados Unidos Country of publication: Estados Unidos
Fulltext
Add to My VHL
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2014 Document type: Article Affiliation country: Estados Unidos Country of publication: Estados Unidos