Evaluation of interface trap densities and quantum capacitance in carbon nanotube network thin-film transistors. | Nanotechnology;27(29): 295704, 2016 Jul 22. | MEDLINE

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Evaluation of interface trap densities and quantum capacitance in carbon nanotube network thin-film transistors.

Yoon, J; Choi, B; Choi, S; Lee, J; Lee, J; Jeon, M; Lee, Y; Han, J; Lee, J; Kim, D M; Kim, D H; Kim, S; Choi, S-J.

Affiliation

Yoon J; School of Electrical Engineering, Kookmin University, 77 Jeongneung-ro, Seongbuk-gu, Seoul 02707, Korea.

Nanotechnology ; 27(29): 295704, 2016 Jul 22.

Article in En | MEDLINE | ID: mdl-27285674

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2016 Document type: Article Country of publication: Reino Unido

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2016 Document type: Article Country of publication: Reino Unido