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Structure and stress studies of low temperature annealed W/Si multilayers for the X-ray telescope.
Opt Express ; 24(14): 15620-30, 2016 Jul 11.
Article in En | MEDLINE | ID: mdl-27410835

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Opt Express Journal subject: OFTALMOLOGIA Year: 2016 Document type: Article Country of publication: Estados Unidos

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Opt Express Journal subject: OFTALMOLOGIA Year: 2016 Document type: Article Country of publication: Estados Unidos