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Critical role of a double-layer configuration in solution-based unipolar resistive switching memories.
Carlos, Emanuel; Kiazadeh, Asal; Deuermeier, Jonas; Branquinho, Rita; Martins, Rodrigo; Fortunato, Elvira.
Affiliation
  • Carlos E; CENIMAT/i3N Departamento de Ciência dos Materiais, Faculdade de Ciências e Tecnologia (FCT), Universidade NOVA de Lisboa (UNL), and CEMOP/UNINOVA, 2829-516 Caparica, Portugal.
Nanotechnology ; 29(34): 345206, 2018 Aug 24.
Article in En | MEDLINE | ID: mdl-29863489
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2018 Document type: Article Affiliation country: Portugal Country of publication: Reino Unido
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2018 Document type: Article Affiliation country: Portugal Country of publication: Reino Unido