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Direct electric field imaging of graphene defects.
Ishikawa, Ryo; Findlay, Scott D; Seki, Takehito; Sánchez-Santolino, Gabriel; Kohno, Yuji; Ikuhara, Yuichi; Shibata, Naoya.
Affiliation
  • Ishikawa R; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan. ishikawa@sigma.t.u-tokyo.ac.jp.
  • Findlay SD; School of Physics and Astronomy, Monash University, Victoria, 3800, Australia.
  • Seki T; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan.
  • Sánchez-Santolino G; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan.
  • Kohno Y; Electron Optics Division, JEOL Ltd., Akishima, Tokyo, 196-855, Japan.
  • Ikuhara Y; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan.
  • Shibata N; Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Aichi, 456-8587, Japan.
Nat Commun ; 9(1): 3878, 2018 09 24.
Article in En | MEDLINE | ID: mdl-30250209
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nat Commun Journal subject: BIOLOGIA / CIENCIA Year: 2018 Document type: Article Affiliation country: Japón Country of publication: Reino Unido
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nat Commun Journal subject: BIOLOGIA / CIENCIA Year: 2018 Document type: Article Affiliation country: Japón Country of publication: Reino Unido