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Quantitative electric field mapping of a p-n junction by DPC STEM.
Toyama, Satoko; Seki, Takehito; Anada, Satoshi; Sasaki, Hirokazu; Yamamoto, Kazuo; Ikuhara, Yuichi; Shibata, Naoya.
Affiliation
  • Toyama S; Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656, Japan.
  • Seki T; Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656, Japan.
  • Anada S; Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan.
  • Sasaki H; Advanced Technologies R&D Laboratories, Furukawa Electric Co., Ltd., Yokohama 220-0073, Japan.
  • Yamamoto K; Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan.
  • Ikuhara Y; Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656, Japan; Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan.
  • Shibata N; Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656, Japan; Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan. Electronic address: shibata@sigma.t.u-tokyo.ac.jp.
Ultramicroscopy ; 216: 113033, 2020 Sep.
Article in En | MEDLINE | ID: mdl-32570133
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2020 Document type: Article Affiliation country: Japón Country of publication: Países Bajos
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2020 Document type: Article Affiliation country: Japón Country of publication: Países Bajos