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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis.
Bennet, Francesca; Müller, Anja; Radnik, Jörg; Hachenberger, Yves; Jungnickel, Harald; Laux, Peter; Luch, Andreas; Tentschert, Jutta.
Affiliation
  • Bennet F; Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM).
  • Müller A; Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM).
  • Radnik J; Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM); joerg.radnik@bam.de.
  • Hachenberger Y; Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR).
  • Jungnickel H; Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR).
  • Laux P; Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR).
  • Luch A; Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR).
  • Tentschert J; Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR); jutta.tentschert@bfr.bund.de.
J Vis Exp ; (163)2020 09 13.
Article in En | MEDLINE | ID: mdl-32986038
Subject(s)
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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Mass Spectrometry / Analytic Sample Preparation Methods / Nanoparticles / Photoelectron Spectroscopy Language: En Journal: J Vis Exp Year: 2020 Document type: Article Country of publication: Estados Unidos
Fulltext
Add to My VHL
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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Mass Spectrometry / Analytic Sample Preparation Methods / Nanoparticles / Photoelectron Spectroscopy Language: En Journal: J Vis Exp Year: 2020 Document type: Article Country of publication: Estados Unidos