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Performance of a silicon-on-insulator direct electron detector in a low-voltage transmission electron microscope.
Ishida, Takafumi; Shinozaki, Akira; Kuwahara, Makoto; Miyoshi, Toshinobu; Saitoh, Koh; Arai, Yasuo.
Affiliation
  • Ishida T; Institute of Materials and Systems for Sustainability, Nagoya University, Furo-cho, Nagoya, Chikusa 464-8601, Japan.
  • Shinozaki A; Graduate School of Engineering, Nagoya University, Furo-cho, Nagoya, Chikusa 464-8601, Japan.
  • Kuwahara M; Graduate School of Engineering, Nagoya University, Furo-cho, Nagoya, Chikusa 464-8601, Japan.
  • Miyoshi T; Institute of Materials and Systems for Sustainability, Nagoya University, Furo-cho, Nagoya, Chikusa 464-8601, Japan.
  • Saitoh K; Graduate School of Engineering, Nagoya University, Furo-cho, Nagoya, Chikusa 464-8601, Japan.
  • Arai Y; Institute of Particle and Nuclear Studies, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba 305-0801, Japan.
Microscopy (Oxf) ; 70(3): 321-325, 2021 Jun 06.
Article in En | MEDLINE | ID: mdl-33180139
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microscopy (Oxf) Year: 2021 Document type: Article Affiliation country: Japón
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microscopy (Oxf) Year: 2021 Document type: Article Affiliation country: Japón