Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM.

Toyama, Satoko; Seki, Takehito; Kanitani, Yuya; Kudo, Yoshihiro; Tomiya, Shigetaka; Ikuhara, Yuichi; Shibata, Naoya

Toyama, Satoko; Seki, Takehito; Kanitani, Yuya; Kudo, Yoshihiro; Tomiya, Shigetaka; Ikuhara, Yuichi; Shibata, Naoya.

Affiliation

Toyama S; Institute of Engineering Innovation, School of Engineering, University of Tokyo, 2-11-16, Yayoi, Bunkyo, Tokyo 113-0032, Japan.
Seki T; Institute of Engineering Innovation, School of Engineering, University of Tokyo, 2-11-16, Yayoi, Bunkyo, Tokyo 113-0032, Japan; PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama, 332-0012, Japan. Electronic address: seki@sigma.t.u-tokyo.ac.jp.
Kanitani Y; Sony Group Corporation, 4-14-1, Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
Kudo Y; Sony Group Corporation, 4-14-1, Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
Tomiya S; Sony Group Corporation, 4-14-1, Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
Ikuhara Y; Institute of Engineering Innovation, School of Engineering, University of Tokyo, 2-11-16, Yayoi, Bunkyo, Tokyo 113-0032, Japan; Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1, Mutsuno, Atsuta, Aichi, 456-8587, Japan.
Shibata N; Institute of Engineering Innovation, School of Engineering, University of Tokyo, 2-11-16, Yayoi, Bunkyo, Tokyo 113-0032, Japan; Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1, Mutsuno, Atsuta, Aichi, 456-8587, Japan. Electronic address: shibata@sigma.t.u-tokyo.ac.jp.

Ultramicroscopy ; 238: 113538, 2022 Aug.

Article in En | MEDLINE | ID: mdl-35567966

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2022 Document type: Article Affiliation country: Japón Country of publication: Países Bajos

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