Your browser doesn't support javascript.
loading
Highly Reliable Threshold Switching Characteristics of Surface-Modulated Diffusive Memristors Immune to Atmospheric Changes.
Song, Young Geun; Kim, Ji Eun; Kwon, Jae Uk; Chun, Suk Yeop; Soh, Keunho; Nahm, Sahn; Kang, Chong-Yun; Yoon, Jung Ho.
Affiliation
  • Song YG; Electronic Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul02791, Republic of Korea.
  • Kim JE; Electronic Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul02791, Republic of Korea.
  • Kwon JU; Department of Materials Science and Engineering, Korea University, Seoul02841, Republic of Korea.
  • Chun SY; Electronic Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul02791, Republic of Korea.
  • Soh K; Department of Materials Science and Engineering, Korea University, Seoul02841, Republic of Korea.
  • Nahm S; Electronic Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul02791, Republic of Korea.
  • Kang CY; KU-KIST Graduate School of Converging Science and Technology, Korea University, Seoul02841, Republic of Korea.
  • Yoon JH; Electronic Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul02791, Republic of Korea.
ACS Appl Mater Interfaces ; 15(4): 5495-5503, 2023 Feb 01.
Article in En | MEDLINE | ID: mdl-36691225
Key words
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Appl Mater Interfaces Journal subject: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Year: 2023 Document type: Article Country of publication: Estados Unidos
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Appl Mater Interfaces Journal subject: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Year: 2023 Document type: Article Country of publication: Estados Unidos