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Fully Integrated Silicon Photonic Erbium-Doped Nanodiode for Few Photon Emission at Telecom Wavelengths.
Tavani, Giulio; Barri, Chiara; Mafakheri, Erfan; Franzò, Giorgia; Celebrano, Michele; Castriotta, Michele; Di Giancamillo, Matteo; Ferrari, Giorgio; Picciariello, Francesco; Foletto, Giulio; Agnesi, Costantino; Vallone, Giuseppe; Villoresi, Paolo; Sorianello, Vito; Rotta, Davide; Finazzi, Marco; Bollani, Monica; Prati, Enrico.
Affiliation
  • Tavani G; L-NESS, Department of Physics, Politecnico di Milano, Via Francesco Anzani 42, I-22100 Como, Italy.
  • Barri C; Istituto di Fotonica e Nanotecnologie, Consiglio Nazionale delle Ricerche, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
  • Mafakheri E; Istituto di Fotonica e Nanotecnologie, Consiglio Nazionale delle Ricerche, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
  • Franzò G; Consiglio Nazionale delle Ricerche, Istituto per la Microelettronica e i Microsistemi (CNR-IMM), Via Santa Sofia 64, I-95123 Catania, Italy.
  • Celebrano M; Department of Physics, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
  • Castriotta M; Department of Electronics, Information and Bioengineering, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
  • Di Giancamillo M; Istituto di Fotonica e Nanotecnologie, Consiglio Nazionale delle Ricerche, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
  • Ferrari G; Department of Electronics, Information and Bioengineering, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
  • Picciariello F; Department of Physics, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
  • Foletto G; Department of Information Engineering, Università degli Studi di Padova, Via Gradenigo 6B, I-35131 Padua, Italy.
  • Agnesi C; Department of Information Engineering, Università degli Studi di Padova, Via Gradenigo 6B, I-35131 Padua, Italy.
  • Vallone G; Department of Information Engineering, Università degli Studi di Padova, Via Gradenigo 6B, I-35131 Padua, Italy.
  • Villoresi P; Department of Information Engineering, Università degli Studi di Padova, Via Gradenigo 6B, I-35131 Padua, Italy.
  • Sorianello V; Department of Information Engineering, Università degli Studi di Padova, Via Gradenigo 6B, I-35131 Padua, Italy.
  • Rotta D; Photonic Networks and Technologies Lab., Consorzio Nazionale Interuniversitario per le Telecomunicazioni (CNIT), I-56124 Pisa, Italy.
  • Finazzi M; CamGraPhIC Srl, Via G. Moruzzi 1, I-56124 Pisa, Italy.
  • Bollani M; TeCIP Institute, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, I-56124 Pisa, Italy.
  • Prati E; Department of Physics, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
Materials (Basel) ; 16(6)2023 Mar 15.
Article in En | MEDLINE | ID: mdl-36984223
Recent advancements in quantum key distribution (QKD) protocols opened the chance to exploit nonlaser sources for their implementation. A possible solution might consist in erbium-doped light emitting diodes (LEDs), which are able to produce photons in the third communication window, with a wavelength around 1550 nm. Here, we present silicon LEDs based on the electroluminescence of Er:O complexes in Si. Such sources are fabricated with a fully-compatible CMOS process on a 220 nm-thick silicon-on-insulator (SOI) wafer, the common standard in silicon photonics. The implantation depth is tuned to match the center of the silicon layer. The erbium and oxygen co-doping ratio is tuned to optimize the electroluminescence signal. We fabricate a batch of Er:O diodes with surface areas ranging from 1 µm × 1 µm to 50 µm × 50 µm emitting 1550 nm photons at room temperature. We demonstrate emission rates around 5 × 106 photons/s for a 1 µm × 1 µm device at room temperature using superconducting nanowire detectors cooled at 0.8 K. The demonstration of Er:O diodes integrated in the 220 nm SOI platform paves the way towards the creation of integrated silicon photon sources suitable for arbitrary-statistic-tolerant QKD protocols.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Materials (Basel) Year: 2023 Document type: Article Affiliation country: Italia Country of publication: Suiza

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Materials (Basel) Year: 2023 Document type: Article Affiliation country: Italia Country of publication: Suiza