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Hidden-information extraction from layered structures through terahertz imaging down to ultralow SNR.
Cui, Yuqing; Xu, Yafei; Han, Donghai; Wang, Xingyu; Shen, Zhonglei; Hou, Yushan; Liang, Junyan; Wang, Xianqiao; Citrin, David S; Zhang, Liuyang; Nandi, Asoke K; Yan, Ruqiang; Chen, Xuefeng.
Affiliation
  • Cui Y; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Xu Y; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Han D; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Wang X; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Shen Z; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Hou Y; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Liang J; School of Chemistry, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Wang X; School of ECAM, University of Georgia, Athens, GA 30602, USA.
  • Citrin DS; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA.
  • Zhang L; Georgia Tech-CNRS IRL2958, Georgia Tech Lorraine, 2 Rue Marconi, 57070 Metz, France.
  • Nandi AK; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Yan R; State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.
  • Chen X; Department of Electronic and Electrical Engineering, Brunel University London, Uxbridge UB8 3PH, UK.
Sci Adv ; 9(40): eadg8435, 2023 Oct 06.
Article in En | MEDLINE | ID: mdl-37792928
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sci Adv Year: 2023 Document type: Article Country of publication: Estados Unidos
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sci Adv Year: 2023 Document type: Article Country of publication: Estados Unidos