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Rapid observation of dispersion curves in system-on-chip devices.
Wei, Zimiao; Chen, Yikai; Li, Junfeng; Wang, Zekai; Wu, Xueqin; Zheng, Jiale; Liu, Xilong; Lan, Wenke; Song, Yang; Shen, Zhonghua; Fu, Qiang.
Affiliation
  • Wei Z; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Chen Y; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Li J; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Wang Z; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Wu X; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Zheng J; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Liu X; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Lan W; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Song Y; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Shen Z; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Fu Q; Department of Optoelectronic Information Science and Engineering, School of Physics and Materials Engineering, Hefei Normal University, Hefei 230601, China.
Rev Sci Instrum ; 94(4)2023 Apr 01.
Article in En | MEDLINE | ID: mdl-38081248
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2023 Document type: Article Affiliation country: China Country of publication: Estados Unidos
Fulltext
Add to My VHL
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2023 Document type: Article Affiliation country: China Country of publication: Estados Unidos