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Defect identification of bare printed circuit boards based on Bayesian fusion of multi-scale features.
Han, Xixi; Li, Renpeng; Wang, Boqin; Lin, Zhibo.
Affiliation
  • Han X; School of Electronic Information, Zhongyuan University of Technology, Zhengzhou, Henan, China.
  • Li R; Anyang Iron and Steel Automation Software Co., Ltd, Zhengzhou, Henan, China.
  • Wang B; School of Electronic Information, Zhongyuan University of Technology, Zhengzhou, Henan, China.
  • Lin Z; School of Electronic Information, Zhongyuan University of Technology, Zhengzhou, Henan, China.
PeerJ Comput Sci ; 10: e1900, 2024.
Article in En | MEDLINE | ID: mdl-38435627
ABSTRACT
The aim of this article is to propose a defect identification method for bare printed circuit boards (PCB) based on multi-feature fusion. This article establishes a description method for various features of grayscale, texture, and deep semantics of bare PCB images. First, the multi-scale directional projection feature, the multi-scale grey scale co-occurrence matrix feature, and the multi-scale gradient directional information entropy feature of PCB were extracted to build the shallow features of defect images. Then, based on migration learning, the feature extraction network of the pre-trained Visual Geometry Group16 (VGG-16) convolutional neural network model was used to extract the deep semantic feature of the bare PCB images. A multi-feature fusion method based on principal component analysis and Bayesian theory was established. The shallow image feature was then fused with the deep semantic feature, which improved the ability of feature vectors to characterize defects. Finally, the feature vectors were input as feature sequences to support vector machines for training, which completed the classification and recognition of bare PCB defects. Experimental results show that the algorithm integrating deep features and multi-scale shallow features had a high recognition rate for bare PCB defects, with an accuracy rate of over 99%.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: PeerJ Comput Sci Year: 2024 Document type: Article Affiliation country: China Country of publication: Estados Unidos

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: PeerJ Comput Sci Year: 2024 Document type: Article Affiliation country: China Country of publication: Estados Unidos