Measurement of hot-electron scattering processes at Au/Si(100) Schottky interfaces by temperature-dependent ballistic-electron-emission microscopy.
Phys Rev B Condens Matter
; 53(7): 3952-3959, 1996 Feb 15.
Article
in En
| MEDLINE
| ID: mdl-9983947
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Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Phys Rev B Condens Matter
Year:
1996
Document type:
Article
Country of publication:
Estados Unidos