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Mechanism of interconversion among radiation-induced defects in amorphous silicon dioxide.
Uchino, T; Takahashi, M; Yoko, T.
Affiliation
  • Uchino T; Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan. uchino@scl.kyoto-u.ac.jp
Phys Rev Lett ; 86(9): 1777-80, 2001 Feb 26.
Article in En | MEDLINE | ID: mdl-11290246
ABSTRACT
We here present a series of ab initio quantum-chemical calculations on clusters of atoms modeling several oxygen-deficiency-related defects in amorphous silica and illustrate how these defect centers will change their atomic configurations upon photoionization. We first give theoretical evidence that structural conversion from a neutral oxygen monovacancy to a divalent Si defect is possible, explaining the observed photoluminescence properties associated with these defects.
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2001 Document type: Article Affiliation country: Japan
Search on Google
Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2001 Document type: Article Affiliation country: Japan