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Magnetic penetration depth measurements of Pr2-xCexCuO4-delta films on buffered substrates: evidence for a nodeless gap.
Kim, Mun-Seog; Skinta, John A; Lemberger, Thomas R; Tsukada, A; Naito, M.
Affiliation
  • Kim MS; Department of Physics, The Ohio State University, Columbus, OH 43210-1106, USA.
Phys Rev Lett ; 91(8): 087001, 2003 Aug 22.
Article in En | MEDLINE | ID: mdl-14525268
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2003 Document type: Article Affiliation country: United States
Search on Google
Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2003 Document type: Article Affiliation country: United States