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Enlarged atomic force microscopy scanning scope: novel sample-holder device with millimeter range.
Sinno, A; Ruaux, P; Chassagne, L; Topçu, S; Alayli, Y; Lerondel, G; Blaize, S; Bruyant, A; Royer, P.
Affiliation
  • Sinno A; LISV, University of Versailles, 45 Avenue des Etats Unis, 78035 Versailles, France.
Rev Sci Instrum ; 78(9): 095107, 2007 Sep.
Article in En | MEDLINE | ID: mdl-17902974
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2007 Document type: Article Affiliation country: France Country of publication: United States
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Add to My VHL
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PubMed Links

Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2007 Document type: Article Affiliation country: France Country of publication: United States