Ellipsometric studies related to surface-enhanced infrared absorption.
Talanta
; 53(1): 9-16, 2000 Oct 02.
Article
in En
| MEDLINE
| ID: mdl-18968082
ABSTRACT
Infrared ellipsometry has been applied to determine the refractive index n and the absorption index k as well as the thickness of metal island films causing surface enhanced infrared absorption (SEIRA). The results from numerous films prepared in several campaigns are presented. For films of a nominal thickness of 6 nm, k is found to range from 0 to 3, while n ranges from 5 to 8. Among these two optical constants a close correlation is observed. Layers suitable for SEIRA exhibit an unusual spectral feature whose origin is explained.
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Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Talanta
Year:
2000
Document type:
Article
Affiliation country:
Germany
Publication country:
HOLANDA
/
HOLLAND
/
NETHERLANDS
/
NL
/
PAISES BAJOS
/
THE NETHERLANDS