Imaging molecular orbitals by scanning tunneling microscopy on a passivated semiconductor.

Bellec, Amandine; Ample, Francisco; Riedel, Damien; Dujardin, Gérald; Joachim, Christian

Bellec, Amandine; Ample, Francisco; Riedel, Damien; Dujardin, Gérald; Joachim, Christian.

Affiliation

Bellec A; Laboratoire de Photophysique Moleculaire, CNRS, Bat. 210, Universite Paris Sud, 91405 Orsay, France, and CEMES-CNRS, 29 rue J. Marvig, P.O. Box 4347, F-31055 Toulouse Cedex, France. amandine.bellec@u-psud.fr

Nano Lett ; 9(1): 144-7, 2009 Jan.

Article in En | MEDLINE | ID: mdl-19090685

Subject(s)

Electrochemistry/methods; Image Enhancement/methods; Microscopy, Scanning Tunneling/methods; Molecular Probe Techniques; Nanostructures/chemistry; Nanostructures/ultrastructure; Nanotechnology/methods; Materials Testing/methods; Particle Size; Semiconductors

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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Image Enhancement / Microscopy, Scanning Tunneling / Molecular Probe Techniques / Nanotechnology / Nanostructures / Electrochemistry Language: En Journal: Nano Lett Year: 2009 Document type: Article Affiliation country: France Country of publication: United States

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