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Photoreflectance and contactless electroreflectance measurements of semiconductor structures by using bright and dark configurations.
Kudrawiec, R; Misiewicz, J.
Affiliation
  • Kudrawiec R; Institute of Physics, Wroclaw University of Technology, Poland. robert.kudrawiec@pwr.wroc.pl
Rev Sci Instrum ; 80(9): 096103, 2009 Sep.
Article in En | MEDLINE | ID: mdl-19791974
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2009 Document type: Article Affiliation country: Poland Country of publication: United States
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Add to My VHL
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2009 Document type: Article Affiliation country: Poland Country of publication: United States