Your browser doesn't support javascript.
loading
Circuit cavity electromechanics in the strong-coupling regime.
Teufel, J D; Li, Dale; Allman, M S; Cicak, K; Sirois, A J; Whittaker, J D; Simmonds, R W.
Affiliation
  • Teufel JD; National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305, USA. john.teufel@nist.gov
Nature ; 471(7337): 204-8, 2011 Mar 10.
Article in En | MEDLINE | ID: mdl-21390127
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Guideline / Prognostic_studies Language: En Journal: Nature Year: 2011 Document type: Article Affiliation country: United States Country of publication: United kingdom
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Guideline / Prognostic_studies Language: En Journal: Nature Year: 2011 Document type: Article Affiliation country: United States Country of publication: United kingdom