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Ahmed, Rizwan; Sams, Michael; Simbrunner, Clemens; Ullah, Mujeeb; Rehman, Kamila; Schwabegger, Günther; Sitter, H; Ostermann, Timm.
Affiliation
  • Ahmed R; Institute of Semiconductor & Solid State Physics, Johannes Kepler Universität, Linz, Austria.
Synth Met ; 161(23-24): 2562-2565, 2012 Jan.
Article in En | MEDLINE | ID: mdl-22368321
ABSTRACT
A comprehensive study concerning the reproducibility and stability of organic n-type field effect transistors is presented. C(60) based OFETs were chosen to investigate the fabrication reproducibility and the long term stability because C(60) is a high mobility n-type material. We fabricated 48 transistors and each transistor was measured for 24 h inside the glove box. To test for life time stability - long term measurements up to three months have been undertaken. We report about the fluctuations in the device parameters of all investigated transistors by comparing the transfer characteristics, and on/off ratio for short time and long time measurements. C(60) based OFETs showed good reproducibility and stability for short time measurements and a decay for long time measurements.

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Synth Met Year: 2012 Document type: Article Affiliation country: Austria

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Synth Met Year: 2012 Document type: Article Affiliation country: Austria