Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast. | Ultramicroscopy;124: 88-95, 2013 Jan. | MEDLINE

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Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast.

Sulyok, A; Toth, A L; Zommer, L; Menyhard, M; Jablonski, A.

Affiliation

Sulyok A; Research Institute for Technical Physics and Materials Science, Budapest H-1525, P.O. Box 49, Hungary.

Ultramicroscopy ; 124: 88-95, 2013 Jan.

Article in En | MEDLINE | ID: mdl-23142749

Subject(s)

Microscopy, Electron, Scanning/methods; Computer Simulation; Electrons; Monte Carlo Method

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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Microscopy, Electron, Scanning Type of study: Health_economic_evaluation / Qualitative_research Language: En Journal: Ultramicroscopy Year: 2013 Document type: Article Affiliation country: Hungary

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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Microscopy, Electron, Scanning Type of study: Health_economic_evaluation / Qualitative_research Language: En Journal: Ultramicroscopy Year: 2013 Document type: Article Affiliation country: Hungary