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Electric stress-induced threshold voltage instability of multilayer MoS2 field effect transistors.
Cho, Kyungjune; Park, Woanseo; Park, Juhun; Jeong, Hyunhak; Jang, Jingon; Kim, Tae-Young; Hong, Woong-Ki; Hong, Seunghun; Lee, Takhee.
Affiliation
  • Cho K; Department of Physics and Astronomy, Seoul National University , Gwanak-ro, Gwanak-gu, Seoul 151-744, Korea.
ACS Nano ; 7(9): 7751-8, 2013 Sep 24.
Article in En | MEDLINE | ID: mdl-23924186
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Nano Year: 2013 Document type: Article Country of publication: United States
Fulltext
Add to My VHL
Print
XML
PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Nano Year: 2013 Document type: Article Country of publication: United States