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Local band gap measurements by VEELS of thin film solar cells.
Keller, Debora; Buecheler, Stephan; Reinhard, Patrick; Pianezzi, Fabian; Pohl, Darius; Surrey, Alexander; Rellinghaus, Bernd; Erni, Rolf; Tiwari, Ayodhya N.
Affiliation
  • Keller D; 1Empa-Swiss Federal Laboratories for Materials Science and Technology,Laboratory for Thin Films and Photovoltaics,Ueberlandstrasse 129,CH-8600 Duebendorf,Switzerland.
  • Buecheler S; 1Empa-Swiss Federal Laboratories for Materials Science and Technology,Laboratory for Thin Films and Photovoltaics,Ueberlandstrasse 129,CH-8600 Duebendorf,Switzerland.
  • Reinhard P; 1Empa-Swiss Federal Laboratories for Materials Science and Technology,Laboratory for Thin Films and Photovoltaics,Ueberlandstrasse 129,CH-8600 Duebendorf,Switzerland.
  • Pianezzi F; 1Empa-Swiss Federal Laboratories for Materials Science and Technology,Laboratory for Thin Films and Photovoltaics,Ueberlandstrasse 129,CH-8600 Duebendorf,Switzerland.
  • Pohl D; 3Institute for Metallic Materials,IFW Dresden,P.O. Box 270116,D-01171 Dresden,Germany.
  • Surrey A; 3Institute for Metallic Materials,IFW Dresden,P.O. Box 270116,D-01171 Dresden,Germany.
  • Rellinghaus B; 3Institute for Metallic Materials,IFW Dresden,P.O. Box 270116,D-01171 Dresden,Germany.
  • Erni R; 2Empa-Swiss Federal Laboratories for Materials Science and Technology,Electron Microscopy Center,Ueberlandstrasse 129,CH-8600 Duebendorf,Switzerland.
  • Tiwari AN; 1Empa-Swiss Federal Laboratories for Materials Science and Technology,Laboratory for Thin Films and Photovoltaics,Ueberlandstrasse 129,CH-8600 Duebendorf,Switzerland.
Microsc Microanal ; 20(4): 1246-53, 2014 Aug.
Article in En | MEDLINE | ID: mdl-24690441
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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Semiconductors / Materials Testing Language: En Journal: Microsc Microanal Year: 2014 Document type: Article Affiliation country: Switzerland Country of publication: United kingdom
Fulltext
Add to My VHL
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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Semiconductors / Materials Testing Language: En Journal: Microsc Microanal Year: 2014 Document type: Article Affiliation country: Switzerland Country of publication: United kingdom