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Element specific monolayer depth profiling.
Macke, Sebastian; Radi, Abdullah; Hamann-Borrero, Jorge E; Verna, Adriano; Bluschke, Martin; Brück, Sebastian; Goering, Eberhard; Sutarto, Ronny; He, Feizhou; Cristiani, Georg; Wu, Meng; Benckiser, Eva; Habermeier, Hanns-Ulrich; Logvenov, Gennady; Gauquelin, Nicolas; Botton, Gianluigi A; Kajdos, Adam P; Stemmer, Susanne; Sawatzky, George A; Haverkort, Maurits W; Keimer, Bernhard; Hinkov, Vladimir.
Affiliation
  • Macke S; Quantum Matter Institute and Department of Physics and Astronomy, University of British Columbia, 2355 East Mall, Vancouver, V6T 1Z4, Canada; Max Planck Institute for Solid State Research, Heisenbergstraße 1, 70569, Stuttgart, Germany.
Adv Mater ; 26(38): 6554-9, 2014 Oct.
Article in En | MEDLINE | ID: mdl-25103570
ABSTRACT
The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.
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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Spectrum Analysis / Nanostructures Language: En Journal: Adv Mater Journal subject: BIOFISICA / QUIMICA Year: 2014 Document type: Article Affiliation country: Germany
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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Spectrum Analysis / Nanostructures Language: En Journal: Adv Mater Journal subject: BIOFISICA / QUIMICA Year: 2014 Document type: Article Affiliation country: Germany