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Small angle X-ray scattering coupled with in situ electromechanical probing of nanoparticle-based resistive strain gauges.
Decorde, Nicolas; Sangeetha, Neralagatta M; Viallet, Benoit; Viau, Guillaume; Grisolia, Jérémie; Coati, Alessandro; Vlad, Alina; Garreau, Yves; Ressier, Laurence.
Affiliation
  • Decorde N; Université de Toulouse, LPCNO, INSA-CNRS-UPS, 135 avenue de Rangueil, Toulouse 31077, France. laurence.ressier@insa-toulouse.fr.
Nanoscale ; 6(24): 15107-16, 2014 Dec 21.
Article in En | MEDLINE | ID: mdl-25371292
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanoscale Year: 2014 Document type: Article Affiliation country: France Country of publication: United kingdom
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanoscale Year: 2014 Document type: Article Affiliation country: France Country of publication: United kingdom