Quantitative electrostatic force microscopy with sharp silicon tips.
Nanotechnology
; 25(49): 495701, 2014 Dec 12.
Article
in En
| MEDLINE
| ID: mdl-25407683
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Nanotechnology
Year:
2014
Document type:
Article
Affiliation country:
Spain
Country of publication:
United kingdom