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Robust helical edge transport in gated InAs/GaSb bilayers.
Du, Lingjie; Knez, Ivan; Sullivan, Gerard; Du, Rui-Rui.
Affiliation
  • Du L; Department of Physics and Astronomy, Rice University, Houston, Texas 77251-1892, USA.
  • Knez I; Department of Physics and Astronomy, Rice University, Houston, Texas 77251-1892, USA.
  • Sullivan G; IBM Research-Almaden, San Jose, California 95120, USA.
  • Du RR; Teledyne Scientific and Imaging, Thousand Oaks, California 91630, USA.
Phys Rev Lett ; 114(9): 096802, 2015 Mar 06.
Article in En | MEDLINE | ID: mdl-25793839
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2015 Document type: Article Affiliation country: United States Country of publication: United States
Search on Google
Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2015 Document type: Article Affiliation country: United States Country of publication: United States