Statistical investigation of the length-dependent deviations in the electrical characteristics of molecular electronic junctions fabricated using the direct metal transfer method. | J Phys Condens Matter;28(9): 094003, 2016 Mar 09. | MEDLINE

Main content 1 Search 2 Footer 3

+A A -A High contrast

VHL Regional Portal

Information and Knowledge for Health

Subject descriptor lookup Advanced Search EVID@Easy

Statistical investigation of the length-dependent deviations in the electrical characteristics of molecular electronic junctions fabricated using the direct metal transfer method.

Jeong, Hyunhak; Kim, Dongku; Kwon, Hyukwoo; Hwang, Wang-Taek; Jang, Yeonsik; Min, Misook; Char, Kookrin; Xiang, Dong; Jeong, Heejun; Lee, Takhee.

Affiliation

Jeong H; Department of Physics and Astronomy, Institute of Applied Physics, Seoul National University, Seoul 08826, Korea.

J Phys Condens Matter ; 28(9): 094003, 2016 Mar 09.

Article in En | MEDLINE | ID: mdl-26871992

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: J Phys Condens Matter Journal subject: BIOFISICA Year: 2016 Document type: Article Country of publication: United kingdom

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: J Phys Condens Matter Journal subject: BIOFISICA Year: 2016 Document type: Article Country of publication: United kingdom