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Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy.
Ponomaryov, Semyon S; Yukhymchuk, Volodymyr O; Lytvyn, Peter M; Valakh, Mykhailo Ya.
Affiliation
  • Ponomaryov SS; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. s.s.ponomaryov@gmail.com.
  • Yukhymchuk VO; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. yukhym@isp.kiev.ua.
  • Lytvyn PM; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. plyt@isp.kiev.ua.
  • Valakh MY; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. valakh@isp.kiev.ua.
Nanoscale Res Lett ; 11(1): 103, 2016 Dec.
Article in En | MEDLINE | ID: mdl-26909783
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanoscale Res Lett Year: 2016 Document type: Article Affiliation country: Ukraine
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanoscale Res Lett Year: 2016 Document type: Article Affiliation country: Ukraine