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New Approach on Quantification of Porosity of Thin Films via Electron-Excited X-ray Spectra.
Ortel, Erik; Hertwig, Andreas; Berger, Dirk; Esposito, Pasquale; Rossi, Andrea M; Kraehnert, Ralph; Hodoroaba, Vasile-Dan.
Affiliation
  • Ortel E; Federal Institute for Materials Research and Testing (BAM), Berlin 12200, Germany.
  • Hertwig A; Federal Institute for Materials Research and Testing (BAM), Berlin 12200, Germany.
  • Berger D; Technische Universität Berlin, Straße des 17. Juni 135, Berlin 10623, Germany.
  • Esposito P; Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce 91, Turin 10135, Italy.
  • Rossi AM; Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce 91, Turin 10135, Italy.
  • Kraehnert R; Technische Universität Berlin, Straße des 17. Juni 135, Berlin 10623, Germany.
  • Hodoroaba VD; Federal Institute for Materials Research and Testing (BAM), Berlin 12200, Germany.
Anal Chem ; 88(14): 7083-90, 2016 07 19.
Article in En | MEDLINE | ID: mdl-27334649
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Anal Chem Year: 2016 Document type: Article Affiliation country: Germany
Fulltext
Add to My VHL
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XML
PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Anal Chem Year: 2016 Document type: Article Affiliation country: Germany