Improving the spatial and statistical accuracy in X-ray Raman scattering based direct tomography.
J Synchrotron Radiat
; 24(Pt 2): 476-481, 2017 03 01.
Article
in En
| MEDLINE
| ID: mdl-28244443
ABSTRACT
An algorithm to simultaneously increase the spatial and statistical accuracy of X-ray Raman scattering (XRS) based tomographic images is presented. Tomography that utilizes XRS spectroscopy signals as a contrast for the images is a new and promising tool for investigating local atomic structure and chemistry in heterogeneous samples. The algorithm enables the spatial resolution to be increased based on a deconvolution of the optical response function of the spectrometer and, most importantly, it allows for the combination of data collected from multiple analyzers and thus enhances the statistical accuracy of the measured images.
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
J Synchrotron Radiat
Journal subject:
RADIOLOGIA
Year:
2017
Document type:
Article
Affiliation country:
France
Publication country:
EEUU
/
ESTADOS UNIDOS
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ESTADOS UNIDOS DA AMERICA
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EUA
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UNITED STATES
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UNITED STATES OF AMERICA
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US
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USA