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True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy.
Vurpillot, Francois; Danoix, Frédéric; Gilbert, Matthieu; Koelling, Sebastian; Dagan, Michal; Seidman, David N.
Affiliation
  • Vurpillot F; 1Normandie Univ,UNIROUEN,INSA Rouen, CNRS,Groupe de Physique des Matériaux,F-76000 Rouen,France.
  • Danoix F; 1Normandie Univ,UNIROUEN,INSA Rouen, CNRS,Groupe de Physique des Matériaux,F-76000 Rouen,France.
  • Gilbert M; 1Normandie Univ,UNIROUEN,INSA Rouen, CNRS,Groupe de Physique des Matériaux,F-76000 Rouen,France.
  • Koelling S; 2Applied Physics,Photonics and Semiconductor Nanophysics,Eindhoven University of Technology,5600MB Eindhoven,The Netherlands.
  • Dagan M; 3Department of Materials,University of Oxford,Parks Road,Oxford OX13PH,UK.
  • Seidman DN; 4Department of Materials Science and Engineering,Northwestern University,2220 Campus Drive,Evanston,IL 60208-3108,USA.
Microsc Microanal ; 23(2): 210-220, 2017 04.
Article in En | MEDLINE | ID: mdl-28337951
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2017 Document type: Article Affiliation country: France Country of publication: United kingdom
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2017 Document type: Article Affiliation country: France Country of publication: United kingdom