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Low-energy electron potentiometry.
Jobst, Johannes; Kautz, Jaap; Mytiliniou, Maria; Tromp, Rudolf M; van der Molen, Sense Jan.
Affiliation
  • Jobst J; Huygens-Kamerlingh Onnes Laboratorium, Leiden University, NL-2300 RA Leiden, P.O. Box 9504, Netherlands; Department of Physics, Columbia University, New York, New York 10027, USA. Electronic address: jo.jobst@gmx.de.
  • Kautz J; Huygens-Kamerlingh Onnes Laboratorium, Leiden University, NL-2300 RA Leiden, P.O. Box 9504, Netherlands.
  • Mytiliniou M; Huygens-Kamerlingh Onnes Laboratorium, Leiden University, NL-2300 RA Leiden, P.O. Box 9504, Netherlands.
  • Tromp RM; Huygens-Kamerlingh Onnes Laboratorium, Leiden University, NL-2300 RA Leiden, P.O. Box 9504, Netherlands; IBM T.J. Watson Research Center, 1101 Kitchawan Road, Yorktown Heights, New York 10598, P.O. Box 218, USA.
  • van der Molen SJ; Huygens-Kamerlingh Onnes Laboratorium, Leiden University, NL-2300 RA Leiden, P.O. Box 9504, Netherlands.
Ultramicroscopy ; 181: 74-80, 2017 10.
Article in En | MEDLINE | ID: mdl-28527312
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2017 Document type: Article Country of publication: Netherlands
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2017 Document type: Article Country of publication: Netherlands