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200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy.
Mamishin, Shuichi; Kubo, Yudai; Cours, Robin; Monthioux, Marc; Houdellier, Florent.
Affiliation
  • Mamishin S; Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
  • Kubo Y; Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
  • Cours R; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse France.
  • Monthioux M; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse France.
  • Houdellier F; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse France. Electronic address: florent.houdellier@cemes.fr.
Ultramicroscopy ; 182: 303-307, 2017 11.
Article in En | MEDLINE | ID: mdl-28806543
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2017 Document type: Article Affiliation country: Japan Country of publication: Netherlands
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2017 Document type: Article Affiliation country: Japan Country of publication: Netherlands