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Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses.
Baik, Sung-Il; Isheim, Dieter; Seidman, David N.
Affiliation
  • Baik SI; Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA; Northwestern University Center for Atom-Probe Tomography, Evanston, IL 60028, USA.
  • Isheim D; Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA; Northwestern University Center for Atom-Probe Tomography, Evanston, IL 60028, USA.
  • Seidman DN; Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA; Northwestern University Center for Atom-Probe Tomography, Evanston, IL 60028, USA. Electronic address: si-baik@northwestern.edu.
Ultramicroscopy ; 184(Pt A): 284-292, 2018 01.
Article in En | MEDLINE | ID: mdl-29054043
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2018 Document type: Article Affiliation country: United States Country of publication: Netherlands
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2018 Document type: Article Affiliation country: United States Country of publication: Netherlands