Investigation on strain relaxation distribution in GaN-based µLEDs by Kelvin probe force microscopy and micro-photoluminescence.

Zhan, Jinglin; Chen, Zhizhong; Jiao, Qianqian; Feng, Yulong; Li, Chengcheng; Chen, Yifan; Chen, Yiyong; Jiao, Fei; Kang, Xiangning; Li, Shunfeng; Wang, Qi; Yu, Tongjun; Zhang, Guoyi; Shen, Bo

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Investigation on strain relaxation distribution in GaN-based µLEDs by Kelvin probe force microscopy and micro-photoluminescence.

Zhan, Jinglin; Chen, Zhizhong; Jiao, Qianqian; Feng, Yulong; Li, Chengcheng; Chen, Yifan; Chen, Yiyong; Jiao, Fei; Kang, Xiangning; Li, Shunfeng; Wang, Qi; Yu, Tongjun; Zhang, Guoyi; Shen, Bo.

Opt Express ; 26(5): 5265-5274, 2018 Mar 05.

Article in En | MEDLINE | ID: mdl-29529731

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Opt Express Journal subject: OFTALMOLOGIA Year: 2018 Document type: Article Country of publication: United States