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Stable contrast mode on TiO2(110) surface with metal-coated tips using AFM.
Li, Yan Jun; Wen, Huanfei; Zhang, Quanzhen; Adachi, Yuuki; Arima, Eiji; Kinoshita, Yukinori; Nomura, Hikaru; Ma, Zongmin; Kou, Lili; Tsukuda, Yoshihiro; Naitoh, Yoshitaka; Sugawara, Yasuhiro; Xu, Rui; Cheng, Zhihai.
Affiliation
  • Li YJ; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan; National Key Laboratory for Electronic Measurement and Technology, North University of China. No. 3, Xueyuan Road, Taiyuan, Shan Xi 030051, China. Electronic address: liyanjun@ap.eng.osaka-u.ac.jp.
  • Wen H; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Zhang Q; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Adachi Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Arima E; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Kinoshita Y; Research Center for Engineering Science, Graduate School of Engineering and Resource Science Akita University, 1-1, Gakuencho, Tegata, Akita 010-8502, Japan.
  • Nomura H; Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
  • Ma Z; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan; National Key Laboratory for Electronic Measurement and Technology, North University of China. No. 3, Xueyuan Road, Taiyuan, Shan Xi 030051, China.
  • Kou L; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Tsukuda Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Naitoh Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Sugawara Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Xu R; CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, PR China.
  • Cheng Z; CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, PR China.
Ultramicroscopy ; 191: 51-55, 2018 08.
Article in En | MEDLINE | ID: mdl-29803917
ABSTRACT
We investigated a method to obtain a stable contrast mode on the TiO2(110) surface. The stable contrast rate is approximately 95% with a W-coated Si cantilever, which demonstrates that a stable tip apex plays an important role to obtain the real geometry of the surface during atomic force microscopy measurement. Information related to surface structure and tunnelling current on the TiO2(110) surface can be obtained by the W-coated Si cantilever. It is possible to investigate the electronic structure and surface potential on the TiO2(110) surface with atomic resolution. In particular, the proposed method could be widely applied to investigate the catalytic activity and the mechanism of a catalytic reaction by a metal-coated tip in the future.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2018 Document type: Article

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2018 Document type: Article