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Depth-dependent atomic valence determination by synchrotron techniques.
Trappen, Robbyn; Zhou, Jinling; Tra, Vu Thanh; Huang, Chih Yeh; Dong, Shuai; Chu, Ying Hao; Holcomb, Mikel B.
Affiliation
  • Trappen R; Department of Physics and Astronomy, West Virginia University, Morgantown, WV 26506, USA.
  • Zhou J; Department of Physics and Astronomy, West Virginia University, Morgantown, WV 26506, USA.
  • Tra VT; Department of Materials Science and Engineering, National Chiao Tung University, 30010 HsinChu, Taiwan.
  • Huang CY; Department of Mechanical and Aerospace Engineering, West Virginia University, Morgantown, WV 26506, USA.
  • Dong S; Department of Physics, Southeast University, Nanjing 211189, People's Republic of China.
  • Chu YH; Department of Materials Science and Engineering, National Chiao Tung University, 30010 HsinChu, Taiwan.
  • Holcomb MB; Department of Physics and Astronomy, West Virginia University, Morgantown, WV 26506, USA.
J Synchrotron Radiat ; 25(Pt 6): 1711-1718, 2018 Nov 01.
Article in En | MEDLINE | ID: mdl-30407181
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 2018 Document type: Article Affiliation country: United States Country of publication: United States
Fulltext
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 2018 Document type: Article Affiliation country: United States Country of publication: United States