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High-speed atomic force microscope with a combined tip-sample scanning architecture.
Liu, Lu; Wu, Sen; Pang, Hai; Hu, Xiaodong; Hu, Xiaotang.
Affiliation
  • Liu L; State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China.
  • Wu S; State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China.
  • Pang H; School of Science, Tianjin University, Tianjin 300072, China.
  • Hu X; State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China.
  • Hu X; State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China.
Rev Sci Instrum ; 90(6): 063707, 2019 Jun.
Article in En | MEDLINE | ID: mdl-31255009
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2019 Document type: Article Affiliation country: China Country of publication: United States
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2019 Document type: Article Affiliation country: China Country of publication: United States