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O-FIB: far-field-induced near-field breakdown for direct nanowriting in an atmospheric environment.
Li, Zhen-Ze; Wang, Lei; Fan, Hua; Yu, Yan-Hao; Sun, Hong-Bo; Juodkazis, Saulius; Chen, Qi-Dai.
Affiliation
  • Li ZZ; 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, 130012 China.
  • Wang L; 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, 130012 China.
  • Fan H; 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, 130012 China.
  • Yu YH; 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, 130012 China.
  • Sun HB; 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun, 130012 China.
  • Juodkazis S; 2State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084 China.
  • Chen QD; 3Nanotechnology Facility, Swinburne University of Technology, John St., Hawthorn, 3122 Vic Australia.
Light Sci Appl ; 9: 41, 2020.
Article in En | MEDLINE | ID: mdl-32194955
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Light Sci Appl Year: 2020 Document type: Article Country of publication: United kingdom
Fulltext
Add to My VHL
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XML
PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Light Sci Appl Year: 2020 Document type: Article Country of publication: United kingdom