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Inverse scattering for reflection intensity phase microscopy.
Matlock, Alex; Sentenac, Anne; Chaumet, Patrick C; Yi, Ji; Tian, Lei.
Affiliation
  • Matlock A; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215, USA.
  • Sentenac A; Institut Fresnel, Aix Marseille Univ., CNRS, Centrale Marseille, Marseille, France.
  • Chaumet PC; Institut Fresnel, Aix Marseille Univ., CNRS, Centrale Marseille, Marseille, France.
  • Yi J; Department of Medicine, Boston University School of Medicine, Boston, MA 02215, USA.
  • Tian L; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215, USA.
Biomed Opt Express ; 11(2): 911-926, 2020 Feb 01.
Article in En | MEDLINE | ID: mdl-32206398
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Biomed Opt Express Year: 2020 Document type: Article Affiliation country: United States Country of publication: United States
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Biomed Opt Express Year: 2020 Document type: Article Affiliation country: United States Country of publication: United States