Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry.
Sci Rep
; 10(1): 10392, 2020 Jun 25.
Article
in En
| MEDLINE
| ID: mdl-32587273
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Sci Rep
Year:
2020
Document type:
Article
Affiliation country:
United States